Laboratory

CERMA

Department

Department of Chemistry

Funding agency(ies)

Conseil de recherches en sciences naturelles et en génie du Canada (CRSNG) – Programme de subvention d’outils et d’instruments de recherche (OIR)

Manufacturer (model)

Asylum Research – MFP-3D Origin

Commissioning

2019

Equipment Description

Atomic force microscopy (AFM) is a technique used to characterize surface morphology with resolution on the order of atomic dimensions. It is a widely used surface imaging technique due to its high resolution and its ability to characterize a wide range of materials. In addition to providing information on surface topography, AFM can be used to measure surface roughness and provide qualitative information on the viscoelasticity of heterogeneous surfaces. The instrument’s image analysis and presentation software enables the measurement and visualization of research results, including cross-sectional analysis, roughness measurements, depth analysis, and histogram analysis.

Technical Specifications

• Scanner

  • Minimum X-Y scan range: 120 µm × 120 µm

  • Z scan range: >15 µm

• Sample holder suitable for measuring large samples

• Standard imaging modes

  • Contact mode

  • Tapping mode (including phase imaging)

  • Surface potential imaging (SKPM)

  • Scanning tunneling microscopy (STM)

  • Conductive AFM imaging

• Other modes

  • Force/distance spectroscopy

  • Current/voltage spectroscopy

  • Nanolithography

  • Nanomanipulation

Areas of expertise

Surface Topography, Force Measurements

Conditions of Use

This service is available to academic and industrial collaborators. This technique requires the presence of a research professional to perform the analysis.

Rental Fees (CAD)

On-Campus

To be determined.

Off-Campus (Academic)

To be determined.

Industry

To be determined.

Reservations

François Otis, M.Sc., chimiste

francois.otis@chm.ulaval.ca

418 656-2131 poste 405339